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Study of the influence of nanoparticles on the performance and the properties of polyamide 6

von Dr. Mohammad Reza Sarbandi

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[1.] Mrs/Fragment 061 06 - Diskussion
Zuletzt bearbeitet: 2015-05-02 20:43:55 WiseWoman
Bhattacharya et al. 2008, Fragment, Gesichtet, Mrs, SMWFragment, Schutzlevel sysop, Verschleierung

Typus
Verschleierung
Bearbeiter
Klgn
Gesichtet
Yes.png
Untersuchte Arbeit:
Seite: 61, Zeilen: 6-13
Quelle: Bhattacharya et al. 2008
Seite(n): 299, Zeilen: 11-17
Electron microscopy is a process of obtaining images using electrons and is frequently used when the magnification required is much larger than what can be achieved by light microscopes that means; when the particles to be monitored are smaller than the wavelength of the visual light (< 400 nm). The physical effect behind this principle is based on wave-particle duality of electrons. The emitted electrons are high-energy matter having wavelength much smaller than that of light and this allows for the resolution of smaller objects. Moreover, the electrons interact with samples in various ways and this allows for the determination of detailed information about them. Electron microscopy is a process of obtaining images using electrons and is frequently used when the magnification required is much larger than what can be achieved by light microscopes, i.e., the particles to be monitored are smaller than the wavelength of the visual light (< 400 nm). It is based on wave-particle duality of electrons. The emitted electrons are high-energy matter having wavelengths much smaller than that of light and this allows for the resolution of smaller objects. Moreover, the electrons interact with samples in various ways and this allows for the determination of detailed information about them.
Anmerkungen
Sichter
(Klgn), SleepyHollow02

[2.] Mrs/Fragment 061 13 - Diskussion
Zuletzt bearbeitet: 2015-05-18 20:31:12 WiseWoman
Fragment, Gesichtet, Mrs, SMWFragment, Schutzlevel sysop, Verschleierung, Wikipedia Electron Microscope 2011

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WiseWoman
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Untersuchte Arbeit:
Seite: 61, Zeilen: 13-19
Quelle: Wikipedia Electron Microscope 2011
Seite(n): 1 (online source), Zeilen: -
The advantages of electron microscopy over X-ray crystallography are, that the specimen need not be a single crystal or even a polycrystalline powder, and also that the Fourier transform reconstruction of the object's magnified structure occurs physically and thus avoids the need for solving the phase problem faced by the X-ray crystallographers after obtaining their X-ray diffraction patterns of a single crystal or polycrystalline powder. The major disadvantage of the transmission electron is the need for extremely thin sections of the specimens, typically less than 100 nanometers. The advantages of electron microscopy over X-ray crystallography are that the specimen need not be a single crystal or even a polycrystalline powder, and also that the Fourier transform reconstruction of the object's magnified structure occurs physically and thus avoids the need for solving the phase problem faced by the X-ray crystallographers after obtaining their X-ray diffraction patterns of a single crystal or polycrystalline powder. The major disadvantage of the transmission electron microscope is the need for extremely thin sections of the specimens, typically about 100 nanometers.
Anmerkungen

No source is given.

Sichter
(WiseWoman) Klgn

[3.] Mrs/Fragment 061 20 - Diskussion
Zuletzt bearbeitet: 2015-05-18 20:35:34 WiseWoman
Bhattacharya et al. 2008, Fragment, Gesichtet, KomplettPlagiat, Mrs, SMWFragment, Schutzlevel sysop

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Untersuchte Arbeit:
Seite: 61, Zeilen: 20-21
Quelle: Bhattacharya et al. 2008
Seite(n): 299, Zeilen: 20-22
The two main electron microscopic techniques available for nanocomposite imaging are the scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The two main electron microscopic techniques available for nanocomposite imaging are the scanning electron microscopy (SEM) and transmission electron microscopy (TEM).
Anmerkungen

"Spliced" plagiarism: The fragment Mrs/Fragment 061 06 is from the same source as this sentence, followed by a portion from the Wikipedia in Mrs/Fragment 061 13, then this fragment, followed by another portion from the Wikipedia Mrs/Fragment 061 23.

Sichter
(Klgn), SleepyHollow02

[4.] Mrs/Fragment 061 23 - Diskussion
Zuletzt bearbeitet: 2015-01-24 23:11:39 WiseWoman
Fragment, Gesichtet, KomplettPlagiat, Mrs, SMWFragment, Schutzlevel sysop, Wikipedia Scanning electron microscope 2011

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KomplettPlagiat
Bearbeiter
SleepyHollow02
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Untersuchte Arbeit:
Seite: 61, Zeilen: 23-26
Quelle: Wikipedia Scanning electron microscope 2011
Seite(n): online, Zeilen: -
A scanning electron microscope (SEM) is a type of electron microscope that images a sample by scanning it with a high-energy beam of electrons in a raster scan pattern. The electrons interact with the atoms that make up the sample producing signals that contain information about the sample's surface topography, composition, and other properties such as electrical conductivity. A scanning electron microscope (SEM) is a type of electron microscope that images a sample by scanning it with a high-energy beam of electrons in a raster scan pattern. The electrons interact with the atoms that make up the sample producing signals that contain information about the sample's surface topography, composition, and other properties such as electrical conductivity.
Anmerkungen

No source is given.

Sichter
(SleepyHollow02), WiseWoman


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