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Typus
Verschleierung
Bearbeiter
Klgn
Gesichtet
Yes.png
Untersuchte Arbeit:
Seite: 61, Zeilen: 6-13
Quelle: Bhattacharya et al. 2008
Seite(n): 299, Zeilen: 11-17
Electron microscopy is a process of obtaining images using electrons and is frequently used when the magnification required is much larger than what can be achieved by light microscopes that means; when the particles to be monitored are smaller than the wavelength of the visual light (< 400 nm). The physical effect behind this principle is based on wave-particle duality of electrons. The emitted electrons are high-energy matter having wavelength much smaller than that of light and this allows for the resolution of smaller objects. Moreover, the electrons interact with samples in various ways and this allows for the determination of detailed information about them. Electron microscopy is a process of obtaining images using electrons and is frequently used when the magnification required is much larger than what can be achieved by light microscopes, i.e., the particles to be monitored are smaller than the wavelength of the visual light (< 400 nm). It is based on wave-particle duality of electrons. The emitted electrons are high-energy matter having wavelengths much smaller than that of light and this allows for the resolution of smaller objects. Moreover, the electrons interact with samples in various ways and this allows for the determination of detailed information about them.
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(Klgn), SleepyHollow02

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